COXEM TABLETOP & COMPACT SEM-EDX

Excellent Resolution & Impressive Features at an Attractive Price
Tabletop SEM EM-30 Plus
Desktop System with Highest Resolution
Coxem-EM-30-Plus
Specifications
  • Highest resolution 5 nm (optical)
  • Tungsten or CeB6 filament
  • Variable high voltage 1-30 kV
  • SE- and BE-detector
  • Magnification up to 150,000 times
  • XYT-stage motorized 35 mm x 35 mm x 45°
  • Z-stage manual 45 mm
  • largest sample ∅ 70 mm
  • EDX detector (Oxford, Bruker)
  • Low Vacuum Mode
  • Joystick
  • Image size up to 5120 x 3840 px (TIF, BMP, PNG, JPG)
Tabletop SEM EM-30
Tabletop System at the Lowest Price
Coxem-EM-30
Specifications
  • Highest resolution 20 nm (optical)
  • Tungsten filament
  • Variable high voltage 1-30 kV
  • SE- and BE-detector
  • Magnification up to 100,000 times
  • XYT-stage motorized 35 mm x 35 mm x 45°
  • Z-stage manual 45 mm
  • largest sample ∅ 70 mm
  • EDX detector (Oxford, Bruker)
  • Image size up to 5120 x 3840 px (TIF, BMP. PNG, JPG)
Compact SEM CX-200 Plus
Small Laboratory System for Large Samples
Coxem-SEM-EDX-CX-200
Specifications
  • Highest resolution 3 nm (optical)
  • Tungsten filament
  • Variable high voltage 1-30 kV
  • SE- and BE-detector
  • Magnification up to 300,000 times
  • XYT stage motorized 60 mm x 60 mm x 90°
  • Z-Stage motorized 55 mm
  • Largest sample ∅ 160 mm
  • EDX detector (Oxford, Bruker)
  • Additional ports for EBSD, STEM, Cooling Stage, etc.
  • Low Vacuum Mode
  • Image size up to 5120 x 3840 px (TIF, BMP. PNG, JPG)

Coxem is a young and innovative manufacturer of compact high-resolution SEM-EDX devices from Korea. The devices convince with outstanding resolution and features that are otherwise only offered in large laboratory equipment. Above that the equipment comes for an attractive price.

The Coxem technology is now available in Germany and exclusively distributed by RJL Micro & Analytic.

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Technology
Highest Resolution

The newly developed electron optics of the EM-30 Plus is capable of achieving a significantly higher resolution (5 nm). The result: razor-sharp images at 100,000x magnification.

Variable High Voltage

Even the finest surface structures can be visualized using a low acceleration voltage (high voltage 1-30 kV).

Low Vacuum Mode

Residual air molecules of the low vacuum allow insulating samples to be discharged and microscopically examined (pressure 1-100 Pa).

You have the choice

In addition to classic tungsten technology, Coxem also offers beam generation through CeB6 filaments. Tungsten cathodes are widely used and very mature. The filaments can be exchanged with a few simple steps by the user himself. CeB6 filaments offer longer life and higher beam intensity, which can be an advantage in low voltage imaging. However, the filaments are much more expensive and usually not to be exchanged by the user.

User-friendly operation
Intuitive Control

Magnification, focus and XY-navigation can be operated using a 3D multifunction joystick

Simple Navigation

Color camera above stage, sample navigation by clicking

Wide Format Scan

Automatic imaging of large sample areas by stitching of single images (high-resolution mosaic)

Material & Element Analysis
Oxford AZtecOne EDX

X-Act X-Ray element spectrometer, thermoelectrically cooled silicone drift detector (SDD), resolution 133 eV at Mn (K), sensitive from Z = 5 (boron), including AZtecOne software package

Bruker Quantax EDX

XFlash 6 X-Ray element spectrometer, thermoelectrically cooled silicone drift detector (SDD), resolution 129 eV at Mn (K), sensitive from Z = 5 (boron), including Esprit Compact software package

Equipment
In-Situ Sample Cooling

Peltier sample cooling down to -25 ° C for microscopic imaging of biological and liquid preparations in a vacuum

STEM Module

Module for scanning transmission microscopy (STEM), BF and DF sensor, including holder for up to four TEM networks

Conductive Coating

Sputter for Au, Pt and other targets, ionization current variable 0-9 mA

Vibration Protection

Anti-vibration table for SEM-EDX device (active)

Cross-Section Polisher

Preparation tool for the production of high-precision cross-sections for SEM-EDX, EBSD, surface polishing by argon ion beam

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