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	<title>Rasterelektronenmikroskopie | RJL Micro &amp; Analytic</title>
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	<link>https://www.rjl-microanalytic.de/en</link>
	<description>Analysis service &amp; instrument from a single source</description>
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	<title>Rasterelektronenmikroskopie | RJL Micro &amp; Analytic</title>
	<link>https://www.rjl-microanalytic.de/en</link>
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	<item>
		<title>Laborkapazität für SEM-EDX Partikelanalytik erfolgreich getestet</title>
		<link>https://www.rjl-microanalytic.de/en/laborkapazitaet-fuer-sem-edx-partikelanalytik-erfolgreich-getestet/</link>
		
		<dc:creator><![CDATA[Markus J. Heneka]]></dc:creator>
		<pubdate>Wed, 15 Oct 2025 07:12:47 +0000</pubdate>
				<category><![CDATA[Firmennachrichten]]></category>
		<category><![CDATA[Innovative Analytik]]></category>
		<category><![CDATA[Sauberkeitsanalyse]]></category>
		<category><![CDATA[SEM-EDX]]></category>
		<category><![CDATA[Analysen mit Akkreditierung]]></category>
		<category><![CDATA[Bauteilsauberkeit]]></category>
		<category><![CDATA[Fremdpartikel]]></category>
		<category><![CDATA[ISO-16232]]></category>
		<category><![CDATA[Partikelanalyse]]></category>
		<category><![CDATA[Prüflabor]]></category>
		<category><![CDATA[Rasterelektronenmikroskopie]]></category>
		<category><![CDATA[Reinheit]]></category>
		<category><![CDATA[Restschmutz]]></category>
		<category><![CDATA[Restschmutzanalyse]]></category>
		<category><![CDATA[Sauberkeitsprüfung]]></category>
		<category><![CDATA[Technische Sauberkeit]]></category>
		<category><![CDATA[VDA-19]]></category>
		<guid ispermalink="false">https://www.rjl-microanalytic.de/?p=15697</guid>

					<description><![CDATA[<p>We recently received a challenge from a client of our testing laboratory. The task was to extract residual contamination particles from 48 components and analyze their origin and risk potential using SEM-EDX – with results delivered within one week!</p>
<p>The post <a href="https://www.rjl-microanalytic.de/en/laborkapazitaet-fuer-sem-edx-partikelanalytik-erfolgreich-getestet/">Laboratory capacity for SEM-EDX particle analysis successfully tested</a> first appeared on <a href="https://www.rjl-microanalytic.de/en">RJL Micro &amp; Analytic</a>.</p>]]></description>
		
		
		
			</item>
		<item>
		<title>Historisches PSEM im Elektronenmikroskopie-Museum Nürnberg zu sehen</title>
		<link>https://www.rjl-microanalytic.de/en/historisches-psem-im-elektronenmikroskopie-museum-nuernberg-zu-sehen/</link>
		
		<dc:creator><![CDATA[Markus J. Heneka]]></dc:creator>
		<pubdate>Mon, 08 Sep 2025 06:48:19 +0000</pubdate>
				<category><![CDATA[Firmennachrichten]]></category>
		<category><![CDATA[Innovative Analytik]]></category>
		<category><![CDATA[SEM-EDX]]></category>
		<category><![CDATA[Partikelanalyse]]></category>
		<category><![CDATA[Rasterelektronenmikroskopie]]></category>
		<category><![CDATA[Restschmutzanalyse]]></category>
		<category><![CDATA[Technische Sauberkeit]]></category>
		<guid ispermalink="false">https://www.rjl-microanalytic.de/?p=15581</guid>

					<description><![CDATA[<p>We recently donated a historic but still functional PSEM microscope from this era to the Nuremberg Electron Microscopy Museum. The museum showcases the history and applications of electron microscopy through a wide range of exhibits and was recently featured in a Bavarian Broadcasting program. We are delighted that our instrument has found a place in the exhibition and will continue to be used there.</p>
<p>The post <a href="https://www.rjl-microanalytic.de/en/historisches-psem-im-elektronenmikroskopie-museum-nuernberg-zu-sehen/">Historical PSEM on display at the Electron Microscopy Museum Nuremberg</a> first appeared on <a href="https://www.rjl-microanalytic.de/en">RJL Micro &amp; Analytic</a>.</p>]]></description>
		
		
		
			</item>
		<item>
		<title>Wir vergeben kostenlose Eintrittskarten für die Parts2Clean 2025</title>
		<link>https://www.rjl-microanalytic.de/en/wir-vergeben-kostenlose-eintrittskarten-fuer-die-parts2clean-2025/</link>
		
		<dc:creator><![CDATA[Markus J. Heneka]]></dc:creator>
		<pubdate>Wed, 27 Aug 2025 09:57:45 +0000</pubdate>
				<category><![CDATA[Firmennachrichten]]></category>
		<category><![CDATA[Innovative Analytik]]></category>
		<category><![CDATA[Sauberkeitsanalyse]]></category>
		<category><![CDATA[Analysen mit Akkreditierung]]></category>
		<category><![CDATA[Bauteilsauberkeit]]></category>
		<category><![CDATA[Fremdpartikel]]></category>
		<category><![CDATA[ISO-16232]]></category>
		<category><![CDATA[Partikelanalyse]]></category>
		<category><![CDATA[Partikelscanner]]></category>
		<category><![CDATA[Prüflabor]]></category>
		<category><![CDATA[Rasterelektronenmikroskopie]]></category>
		<category><![CDATA[Reinheit]]></category>
		<category><![CDATA[Restschmutz]]></category>
		<category><![CDATA[Restschmutzanalyse]]></category>
		<category><![CDATA[Sauberkeitsprüfung]]></category>
		<category><![CDATA[SEM-EDX]]></category>
		<category><![CDATA[Technische Sauberkeit]]></category>
		<category><![CDATA[VDA-19]]></category>
		<guid ispermalink="false">https://www.rjl-microanalytic.de/?p=15556</guid>

					<description><![CDATA[<p>Intraoperative margin assessment using X-rays has long been standard in breast cancer treatment in countries such as the USA, China, Japan, and the UK. Although the procedure can significantly reduce the number of repeat surgeries, the technology has been adopted only hesitantly in Germany.</p>
<p>The post <a href="https://www.rjl-microanalytic.de/en/wir-vergeben-kostenlose-eintrittskarten-fuer-die-parts2clean-2025/">We are giving away free tickets for Parts2Clean 2025</a> first appeared on <a href="https://www.rjl-microanalytic.de/en">RJL Micro &amp; Analytic</a>.</p>]]></description>
		
		
		
			</item>
		<item>
		<title>Innovatives Ionenstrahlätzsystem für die SEM-Zielpräparation von Batterie-Elektroden</title>
		<link>https://www.rjl-microanalytic.de/en/innovatives-ionenstrahlaetzsystem-fuer-die-sem-zielpraeparation-von-batterie-elektroden/</link>
		
		<dc:creator><![CDATA[Markus J. Heneka]]></dc:creator>
		<pubdate>Wed, 12 Oct 2022 05:52:25 +0000</pubdate>
				<category><![CDATA[Innovative Analytik]]></category>
		<category><![CDATA[SEM-EDX]]></category>
		<category><![CDATA[Coxem]]></category>
		<category><![CDATA[Elektroden]]></category>
		<category><![CDATA[Ionenstrahlätzsystem]]></category>
		<category><![CDATA[Lithium-Batterie]]></category>
		<category><![CDATA[Rasterelektronenmikroskopie]]></category>
		<category><![CDATA[Tabletop SEM-EDX]]></category>
		<guid ispermalink="false">https://www.rjl-microanalytic.de/?p=11943</guid>

					<description><![CDATA[<p>Coxem has introduced a new model of its compact ion mill CP-8000+. The device supports the standard cutting (“cross-sectioning”) and polishing (“flat milling”) modalities and can be operated intuitively via the integrated touchscreen.</p>
<p>The post <a href="https://www.rjl-microanalytic.de/en/innovatives-ionenstrahlaetzsystem-fuer-die-sem-zielpraeparation-von-batterie-elektroden/">Innovative ion beam etching system for SEM target preparation of battery electrodes</a> first appeared on <a href="https://www.rjl-microanalytic.de/en">RJL Micro &amp; Analytic</a>.</p>]]></description>
		
		
		
			</item>
		<item>
		<title>Zufriedener Coxem-Kunde sendet eine Panorama-Grußkarte</title>
		<link>https://www.rjl-microanalytic.de/en/zufriedener-coxem-kunde-sendet-eine-panorama-grusskarte/</link>
		
		<dc:creator><![CDATA[Markus J. Heneka]]></dc:creator>
		<pubdate>Sun, 15 May 2022 20:00:07 +0000</pubdate>
				<category><![CDATA[Innovative Analytik]]></category>
		<category><![CDATA[SEM-EDX]]></category>
		<category><![CDATA[Coxem]]></category>
		<category><![CDATA[Rasterelektronenmikroskopie]]></category>
		<category><![CDATA[Tabletop SEM-EDX]]></category>
		<guid ispermalink="false">https://new.rjl-microanalytic.de/?p=6925</guid>

					<description><![CDATA[<p>A year and a half ago we installed a Coxem EM-30N at the Eberswalde University for Sustainable Development (HNEE). This mosaic shows a 3-point bending fracture in a deformed wood sample. With the standard integrated panorama module from Coxem, 169 individual images of a microtome section of the fracture site were collected at 200x magnification with the secondary electron detector and automatically stitched.</p>
<p>The post <a href="https://www.rjl-microanalytic.de/en/zufriedener-coxem-kunde-sendet-eine-panorama-grusskarte/">Satisfied Coxem Customer Sends a Panoramic Greeting Card</a> first appeared on <a href="https://www.rjl-microanalytic.de/en">RJL Micro &amp; Analytic</a>.</p>]]></description>
		
		
		
			</item>
		<item>
		<title>EBSD-Analytik zum ersten Mal in einem Tabletop SEM-EDX realisiert</title>
		<link>https://www.rjl-microanalytic.de/en/ebsd-analytik-zum-ersten-mal-in-einem-tabletop-sem-edx-realisiert/</link>
		
		<dc:creator><![CDATA[Markus J. Heneka]]></dc:creator>
		<pubdate>Fri, 13 Aug 2021 20:00:00 +0000</pubdate>
				<category><![CDATA[Innovative Analytik]]></category>
		<category><![CDATA[SEM-EDX]]></category>
		<category><![CDATA[Coxem]]></category>
		<category><![CDATA[EBSD]]></category>
		<category><![CDATA[Rasterelektronenmikroskopie]]></category>
		<guid ispermalink="false">https://new.rjl-microanalytic.de/?p=1443</guid>

					<description><![CDATA[<p>We supported Bruker Nano in the world's first commissioning of a compact EBSD system on our Coxem Tabletop SEM-EDX. The installation went smoothly and after one hour we were able to record the first EBSD mappings ‒ Important step for the market introduction of the EBSD technology for SEM-EDX tabletop devices.</p>
<p>The post <a href="https://www.rjl-microanalytic.de/en/ebsd-analytik-zum-ersten-mal-in-einem-tabletop-sem-edx-realisiert/">EBSD Implemented for the First Time in a Tabletop SEM-EDX</a> first appeared on <a href="https://www.rjl-microanalytic.de/en">RJL Micro &amp; Analytic</a>.</p>]]></description>
		
		
		
			</item>
		<item>
		<title>Coxem stellt BE-Detektor mit hervorragender Z-Auflösung vor</title>
		<link>https://www.rjl-microanalytic.de/en/coxem-stellt-be-detektor-mit-hervorragender-z-aufloesung-vor/</link>
		
		<dc:creator><![CDATA[Markus J. Heneka]]></dc:creator>
		<pubdate>Tue, 17 Nov 2020 20:00:00 +0000</pubdate>
				<category><![CDATA[Innovative Analytik]]></category>
		<category><![CDATA[SEM-EDX]]></category>
		<category><![CDATA[Coxem]]></category>
		<category><![CDATA[Rasterelektronenmikroskopie]]></category>
		<guid ispermalink="false">https://new.rjl-microanalytic.de/?p=1435</guid>

					<description><![CDATA[<p>Coxem recently presented a new backscattered electron detector (BE) for their SEM-EDX systems, which impresses with its excellent sensitivity. The new BE detector is particularly interesting for applications that benefit from a high contrast of the atomic number Z.</p>
<p>The post <a href="https://www.rjl-microanalytic.de/en/coxem-stellt-be-detektor-mit-hervorragender-z-aufloesung-vor/">Coxem Introduces BE Detector with Excellent Z Resolution</a> first appeared on <a href="https://www.rjl-microanalytic.de/en">RJL Micro &amp; Analytic</a>.</p>]]></description>
		
		
		
			</item>
		<item>
		<title>Wir unterstützen Helios bei der Aufarbeitung von FFP-Schutzmasken</title>
		<link>https://www.rjl-microanalytic.de/en/helios-aufarbeitung-von-ffp-schutzmasken/</link>
		
		<dc:creator><![CDATA[Markus J. Heneka]]></dc:creator>
		<pubdate>Tue, 21 Apr 2020 20:00:00 +0000</pubdate>
				<category><![CDATA[Innovative Analytik]]></category>
		<category><![CDATA[Röntgenmikroskopie]]></category>
		<category><![CDATA[SEM-EDX]]></category>
		<category><![CDATA[industrielle Computer-Tomographie]]></category>
		<category><![CDATA[Micro-CT]]></category>
		<category><![CDATA[Mikrotomographie]]></category>
		<category><![CDATA[Nano-CT]]></category>
		<category><![CDATA[Nanotomographie]]></category>
		<category><![CDATA[Partikelanalyse]]></category>
		<category><![CDATA[Rasterelektronenmikroskopie]]></category>
		<category><![CDATA[Röntgenbildgebung]]></category>
		<category><![CDATA[Röntgentomographie]]></category>
		<guid ispermalink="false">https://new.rjl-microanalytic.de/?p=1429</guid>

					<description><![CDATA[<p>Given the continuing shortage of protection materials for hospital staff during the Corona crisis, Helios experts have in the past weeks developed a safe procedure for refurbishing FFP masks. Helios is making this method publically available, so that all medical staff can be supplied with sufficient protective materials.</p>
<p>The post <a href="https://www.rjl-microanalytic.de/en/helios-aufarbeitung-von-ffp-schutzmasken/">We Support Helios in the Refurbishment of FFP Protective Masks</a> first appeared on <a href="https://www.rjl-microanalytic.de/en">RJL Micro &amp; Analytic</a>.</p>]]></description>
		
		
		
			</item>
		<item>
		<title>Überraschender Fund von Kieselalgen mittels SEM-EDX</title>
		<link>https://www.rjl-microanalytic.de/en/ueberraschender-fund-von-kieselalgen/</link>
		
		<dc:creator><![CDATA[Markus J. Heneka]]></dc:creator>
		<pubdate>Mon, 16 Mar 2020 20:00:00 +0000</pubdate>
				<category><![CDATA[Innovative Analytik]]></category>
		<category><![CDATA[SEM-EDX]]></category>
		<category><![CDATA[Coxem]]></category>
		<category><![CDATA[Rasterelektronenmikroskopie]]></category>
		<guid ispermalink="false">https://new.rjl-microanalytic.de/?p=1425</guid>

					<description><![CDATA[<p>Researchers from Bremen provided us with this interesting sample of volcanic ash, which we analyzed with our Coxem Tabletop SEM-EDX. In addition to the spongy structure of the fine ash particles typical of volcanic eruptions, we identified various microfossils, so-called diatoms.</p>
<p>The post <a href="https://www.rjl-microanalytic.de/en/ueberraschender-fund-von-kieselalgen/">Surprising Discovery of Diatoms Using SEM-EDX</a> first appeared on <a href="https://www.rjl-microanalytic.de/en">RJL Micro &amp; Analytic</a>.</p>]]></description>
		
		
		
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