{"id":13384,"date":"2024-06-26T11:45:18","date_gmt":"2024-06-26T09:45:18","guid":{"rendered":"https:\/\/www.rjl-microanalytic.de\/?p=13384"},"modified":"2024-07-08T16:13:19","modified_gmt":"2024-07-08T14:13:19","slug":"particle-browser-ein-neues-werkzeug-zur-nachkontrolle-der-sem-edx-partikelanalyse","status":"publish","type":"post","link":"https:\/\/www.rjl-microanalytic.de\/en\/particle-browser-ein-neues-werkzeug-zur-nachkontrolle-der-sem-edx-partikelanalyse\/","title":{"rendered":"Particle Browser: A new tool for post-processing of SEM-EDX particle analysis"},"content":{"rendered":"<div data-elementor-type=\"wp-post\" data-elementor-id=\"13384\" class=\"elementor elementor-13384\" data-elementor-post-type=\"post\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-7934927 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"7934927\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-f3cf1dc\" data-id=\"f3cf1dc\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-72522b7 elementor-widget elementor-widget-text-editor\" data-id=\"72522b7\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>Anyone who has a cleanliness test carried out on samples relies on a reliable examination and precise determination and representation of the particles contained. With our Particle Browser, we offer you software for follow-up checks and revisions in order to verify analysis results and to identify and correct possible measurement errors. The process is simple and has already convinced a large number of our customers.<\/p><p>With the Particle Browser, fragmented or overlapping particles as well as errors in material classification can be easily detected and corrected:<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-27e44f9 elementor-widget elementor-widget-image\" data-id=\"27e44f9\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"655\" height=\"720\" src=\"https:\/\/www.rjl-microanalytic.de\/wp-content\/uploads\/Nachkontrolle-SEM-EDX-Partikel-Morphologie-Spektrum.png\" class=\"attachment-full size-full wp-image-13036\" alt=\"\" srcset=\"https:\/\/www.rjl-microanalytic.de\/wp-content\/uploads\/Nachkontrolle-SEM-EDX-Partikel-Morphologie-Spektrum.png 655w, https:\/\/www.rjl-microanalytic.de\/wp-content\/uploads\/Nachkontrolle-SEM-EDX-Partikel-Morphologie-Spektrum-273x300.png 273w, https:\/\/www.rjl-microanalytic.de\/wp-content\/uploads\/Nachkontrolle-SEM-EDX-Partikel-Morphologie-Spektrum-11x12.png 11w\" sizes=\"(max-width: 655px) 100vw, 655px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-b5a7ac7 elementor-widget elementor-widget-text-editor\" data-id=\"b5a7ac7\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>The software is compatible with <a class=\"unterstrichen\" href=\"https:\/\/www.rjl-microanalytic.de\/en\/instrumente\/aspex-explorer-sem-edx-partikelanalyser\/\">ASPEX Explorer, Express &amp; PSEM<\/a> as well as with the <a class=\"unterstrichen\" href=\"https:\/\/www.rjl-microanalytic.de\/en\/instrumente\/thermo-phenom-particlex-sem-edx-partikelanalyse-cleanliness-gsr-steel-inclusions-powders\/\">Phenom ParticleX<\/a> and is used as a postprocessor or in conjunction with the SEM-EDX. If you are interested, we will be happy to provide you with a free test license for the Particle Browser.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-f58b982 elementor-icon-list--layout-traditional elementor-list-item-link-full_width elementor-widget elementor-widget-icon-list\" data-id=\"f58b982\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"icon-list.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<ul class=\"elementor-icon-list-items\">\n\t\t\t\t\t\t\t<li class=\"elementor-icon-list-item\">\n\t\t\t\t\t\t\t\t\t\t\t<a href=\"\/en\/instrumente\/particle-browser-nachkontrolle-revison-sem-edx-partikelanalyse\/\">\n\n\t\t\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-icon-list-icon\">\n\t\t\t\t\t\t\t<i aria-hidden=\"true\" class=\"fas fa-info-circle\"><\/i>\t\t\t\t\t\t<\/span>\n\t\t\t\t\t\t\t\t\t\t<span class=\"elementor-icon-list-text\">Learn more about Particle Browser<\/span>\n\t\t\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t<\/li>\n\t\t\t\t\t\t<\/ul>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"<p>Anyone who has samples tested for cleanliness relies on reliable testing and precise determination and representation of the particles contained. With our Particle Browser, we offer you software for follow-up checks and revisions to verify analysis results and to identify and correct possible measurement errors. <\/p>","protected":false},"author":1,"featured_media":13382,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[9,11,12],"tags":[14,22,32,68,38,39,41,43,44,45,49,50],"class_list":["post-13384","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-innovative-analytik","category-analyse-technische-sauberkeit","category-elektronenmikroskopie-sem-edx","tag-bauteilsauberkeit","tag-iso-16232","tag-partikelanalyse","tag-prueflabor","tag-restschmutz","tag-restschmutzanalyse","tag-roentgenelementanalyse","tag-sauberkeitsanalyse","tag-sauberkeitspruefung","tag-sem-edx","tag-technische-sauberkeit","tag-vda-19"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/posts\/13384","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/comments?post=13384"}],"version-history":[{"count":27,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/posts\/13384\/revisions"}],"predecessor-version":[{"id":13762,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/posts\/13384\/revisions\/13762"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/media\/13382"}],"wp:attachment":[{"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/media?parent=13384"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/categories?post=13384"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/tags?post=13384"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}