{"id":1407,"date":"2019-03-29T22:00:00","date_gmt":"2019-03-29T20:00:00","guid":{"rendered":"https:\/\/new.rjl-microanalytic.de\/?p=1407"},"modified":"2023-06-02T15:46:31","modified_gmt":"2023-06-02T13:46:31","slug":"dem-killerpartikel-auf-der-spur","status":"publish","type":"post","link":"https:\/\/www.rjl-microanalytic.de\/en\/dem-killerpartikel-auf-der-spur\/","title":{"rendered":"Tracking down the Killer Particle"},"content":{"rendered":"<div data-elementor-type=\"wp-post\" data-elementor-id=\"1407\" class=\"elementor elementor-1407\" data-elementor-post-type=\"post\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-43cba7f elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"43cba7f\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-7ba4026\" data-id=\"7ba4026\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-4f77848 elementor-widget elementor-widget-text-editor\" data-id=\"4f77848\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p class=\"translation-block\">When it comes to component cleanliness, the hardest particles are the ones that cause the greatest damage. Finding these killer particles is difficult, because they can be so small that they are not detectable with a light microscope. The <a class=\"unterstrichen\" href=\"\/en\/analysenservice-mit-iso-17025-akkreditierung\/sem-edx-analytik-von-strukturen-und-werkstoffen\/\" target=\"_self\">SEM-EDX scanning electron microscope<\/a> determines the hardness as well as the origin of particles and measures even the smallest particles below 1 \u03bcm very precisely by scanning with an electron beam.<\/p><p>The figure shows the electron microscopic representation of a corundum particle with element spectrum, collected with a SEM-EDX. Corundum is an oxide of aluminum that is typically used as a grinding and blasting agent. With a Mohs hardness of 9, it is a particularly hard mineral and one of the dreaded killer particles. The whitish corundum particles are generally only &lt;20 \u03bcm in size, meaning classification is only possible by means of SEM-EDX.<\/p><p>Inform yourself about our\u00a0<a class=\"unterstrichen\" href=\"\/en\/analysenservice-mit-iso-17025-akkreditierung\/sem-edx-analytik-von-strukturen-und-werkstoffen\/\">SEM-EDX Analytics<\/a>\u00a0as well as our\u00a0<a class=\"unterstrichen\" href=\"\/en\/analysenservice-mit-iso-17025-akkreditierung\/\">accredited analysis service<\/a>.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"<p>When it comes to component cleanliness, the hardest particles cause the most damage. The difficulty, however, is finding these killer particles because they can be so small that they cannot be seen with a light microscope.<\/p>","protected":false},"author":1,"featured_media":1994,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[9,12],"tags":[37,45],"class_list":["post-1407","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-innovative-analytik","category-elektronenmikroskopie-sem-edx","tag-rasterelektronenmikroskopie","tag-sem-edx"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/posts\/1407","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/comments?post=1407"}],"version-history":[{"count":15,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/posts\/1407\/revisions"}],"predecessor-version":[{"id":10300,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/posts\/1407\/revisions\/10300"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/media\/1994"}],"wp:attachment":[{"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/media?parent=1407"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/categories?post=1407"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.rjl-microanalytic.de\/en\/wp-json\/wp\/v2\/tags?post=1407"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}