COXEM TABLETOP & COMPACT SEM-EDX
Excellent resolution & features at an attractive price
Tabletop SEM EM-30N
Tabletop SEM with Highest Resolution
Specifications
- Highest resolution 5 nm (optical)
- Tungsten or CeB6 filament
- Variable high voltage 1-30 kV
- SE- and BE-detector
- Magnification up to 150,000x
- XYT-stage motorized 35 mm x 35 mm x 45°
- Z-Stage manual 45mm
- Largest sample ∅ 70 mm
- EDX detector (Oxford, Bruker)
- Low Vacuum Mode
- Joystick
- CCD camera
- Panorama module
- Additional port for STEM, Cooling Stage or EBSD
- Image size up to 5120 x 3840 px (TIF, BMP, PNG, JPG)
Tabletop SEM EM-30
Tabletop SEM at Lowest Price
Specifications
- Highest resolution 5 nm (optical)
- Tungsten filament
- Variable high voltage 1-30 kV
- SE detector
- Magnification up to 150,000x
- XYT-stage motorized 35 mm x 35 mm x 45°
- Z-Stage manual 45mm
- Largest sample ∅ 70 mm
- EDX detector (Oxford, Bruker)
- Image size up to 5120 x 3840 px (TIF, BMP, PNG, JPG)
Compact SEM CX-200 Plus
Compact SEM for Large Samples
Specifications
- Highest resolution 3 nm (optical)
- Tungsten filament
- Variable high voltage 1-30 kV
- SE- and BE-detector
- Magnification up to 300,000x
- XYT stage motorized 60 mm x 60 mm x 90°
- Z-Stage motorized 55 mm
- Largest sample ∅ 160 mm
- EDX detector (Oxford, Bruker)
- Low Vacuum Mode
- Live camera
- Panorama module
- Additional ports for EBSD, STEM, Cooling Stage, etc.
- Image size up to 5120 x 3840 px (TIF, BMP, PNG, JPG)
Small Picture Gallery
Coxem is a young and innovative manufacturer of compact high-resolution SEM-EDX instruments from Korea. The instruments convince with outstanding resolution and features that are otherwise only offered in large laboratory equipment. Above that the equipment comes for an attractive price.
The Coxem technology is now available in Germany and exclusively distributed by RJL Micro & Analytic.
Technology
Highest Resolution and Contrast
The newly developed electron optics of the Coxem compact SEMs achieve pin-sharp images at 100.000x magnification (left) and visualize the finest material contrast Z < 0.1 (right).
Variable High Voltage
Even the finest surface structures can be visualized using a low acceleration voltage (high voltage 1-30 kV).
Low Vacuum Mode
Residual air molecules of the low vacuum allow insulating samples to be discharged and microscopically examined (pressure 1-100 Pa).
You have the Choice
In addition to the classic tungsten technology, Coxem also offers beam generation using CeB6 filaments. Tungsten cathodes are widespread and very mature. The filaments can be exchanged by the user himself in a few simple steps. CeB6 filaments offer longer life and higher beam intensity, which can be an advantage when imaging with low voltage. However, the filaments are much more expensive and usually cannot be replaced by the user. Due to the different requirements for the operating vacuum level, CeB6 instruments must run in stand-by at all times. Tungsten instruments, on the other hand, can be switched off completely when not in use and are still operational within a few minutes.
User-Friendly Operation
Intuitive Control
Magnification, focus and XY-navigation can be operated using a 3D multifunction joystick
Simple Navigation
Color camera above stage, sample navigation by clicking
Wide Format Scan
Automatic imaging of large sample areas by stitching of single images (high-resolution mosaic)
material and element analysis
Oxford AZtecOne EDX
XploreCompact X-ray element spectrometer, thermoelectrically cooled silicone drift detector (SDD), resolution 129 eV at Mn (K), sensitive from Z = 5 (boron), including AZtecOne software package
Bruker Quantax EDX
XFlash 6 X-Ray element spectrometer, thermoelectrically cooled silicone drift detector (SDD), resolution 129 eV at Mn (K), sensitive from Z = 5 (boron), including Esprit Compact software package
Bruker Quantax XS
eFlash XS detector for electron backscatter diffraction (EBSD), no calibration required, available in combination with EDX, including Esprit software package
Equipment
In-Situ Sample Cooling
Peltier sample cooling down to -25°C for microscopic imaging of biological and liquid preparations in a vacuum
STEM module
Module for scanning transmission microscopy (STEM), BF and DF sensor, including holder for up to four TEM networks
Conductive Coating
Sputter for Au, Pt and other targets, ionization current variable 0-9 mA
Vibration Protection
Anti-vibration table for SEM-EDX instrument (active)
Cross-Section Polisher
Preparation tool for the production of high-precision cross-sections for SEM-EDX, EBSD, surface polishing by argon ion beam
