X-Ray microtomography is an important analytical tool for material optimization and quality control of components. Components are inspected non-destructively and without preparation, thus eliminating the hassle of embedding, cutting and polishing. Reconstruction in 3D quickly reveals pores, voids and other imperfections.
In the following example, we scanned an aluminum die-cast component and analyzed its pore space for a costumer from the automotive industry,
The following video shows the analysis of the computer unit (CPU) of a microcontroller. On behalf of the customer, we examined the quality of the bonding and the BGA backside soldering.
In the following example, we scanned a cylindrical pleated filter element after operation. In this analysis, we were able to show the dimensional stability of the folding after printing operation and represent the local particle loading.