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      SEM-EDX devices combine microscopic imaging with spatially resolved elemental analysis. This universal tool must not be missing in any laboratory. Benefit from our years of experience.
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  • HOME
    • Contact
    • About Us
    • Team
    • News
    • Events
  • INSTRUMENTS
    • GUARANTEE
    • TECHNOLOGIES
      • X-Ray Micro & Nano-CT
      • Particle Scanner
      • Tabletop SEM-EDX
      • SEM-EDX Particle Analyzer
      • Digital X-Ray Imaging
      • Raman Microscopy
      • Tabletop SIMS
    • BRANDS
      • Bruker SkyScan
      • MicroQuick
      • Coxem
      • Aspex Explorer
      • Kubtec
      • Nanophoton
      • MiniSIMS
  • LABORATORY
    • INTEGRITY
    • INFO & SERVICES
      • Service with Accreditation
      • Laboratory Equipment
      • Contact Partner
      • Getting in Touch
    • FIELDS OF WORK
      • Technical Cleanliness
      • X-Ray Microtomography
      • SEM-EDX analytics
      • Identification of Particles
      • Organic Substances
      • Analysis of Steel Inclusions
  • CLEANLINESS ANALYSIS
    • EXPERIENCE
    • INFO & SERVICES
      • Contamination Analysis
      • What is Technical Cleanliness?
      • Test Standards & Regulations
      • Seminars VDA-19 & ISO-16232
      • Analyses with Accreditation
    • DEVICES & PRODUCTS
      • MicroQuick Particle Scanner
      • SEM-EDX Particle Analyzer
      • MicroEx Extraction System
      • Particle Traps, Stamps, etc.
      • Distribution Worldwide
  • MICRO-CT
    • INNOVATION
    • INFO & SERVICES
      • What is Microtomography?
      • Bruker SkyScan Instruments
      • Analyses with Accreditation
    • APPLICATIONS
      • Materials & Components
      • Filters, Composites & Foams
      • Tablets & Medical Devices
      • Biology, Archeology & Preclinical
      • 3D Particle Analysis
  • SEM-EDX
    • UNIVERSAL
    • INFO & PRODUCTS
      • How does SEM-EDX work?
      • Identification of particles
      • Analysis of Steel Inclusions
      • Coxem SEM-EDX tabletop instrument
      • SEM-EDX Particle Analyzer
    • GUIDE
      • SEM-EDX: models and prices
      • Magnification and resolution
      • Detectors for SEM
      • electron source
      • Comfort and options

NEWS-BLOG

April 21, 2020 In Company News, Innovative Analytics, X-Ray Tomography, SEM-EDX

We support Helios in the refurbishment of FFP protective masks

Helios_Wiederaufbereitung_FFP_Masken_Illustrationen

Given the continuing shortage of protection materials for hospital staff during the Corona crisis, Helios experts have in the past weeks developed a safe procedure for refurbishing FFP masks. Helios is making this method publically available, so that all medical staff can be supplied with sufficient protective materials.

Together with our team, we supported the Helios clinics in the development of the procedure by examining the FFP protective masks before and after the refurbishment in our test laboratory. We will continue to support the project in the future and will be closely involved in a concept for constant quality control. We congratulate Helios on this important success and are proud that we can continue contributing to it.

Read the Helios press release on refurbishing FFP masks here.

Industrial computer tomography Micro-CT Microtomography Nano-CT Nanotomography particle analysis Scanning electron microscopy X-Ray imaging X-Ray Tomography SEM-EDX

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SUBJECTS

  • Company News (18)
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Component cleanliness Bruker Micro-CT Coxem Filmic contamination FTIR Industrial computer tomography Infrared spectroscopy ISO-16232 ISO-17025 Medical device Micro-CT MicroQuick Microplastics Microtomography molecular spectroscopy Nano-CT Nanotomography particle analysis Particle Scanner Pressestimme Preclinical imaging Raman spectroscopy Scanning electron microscopy purity Residual contaminates Contamination Analysis X-Ray imaging X-Ray analysis X-Ray Tomography Cleanliness Analysis Cleanliness Inspection SEM-EDX SkyScan Social commitment Job ad Technical Cleanliness VDA-19 VDI 2083 sheet 21

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Fax: + 49-7251-367-9079
E-Mail: zentrale(at)rjl-microanalytic.de

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