PARTICLE BROWSER
Follow-up inspection & revision for SEM-EDX particle analysis
Cleanliness Inspection
Why follow-up checks at all?
![](https://www.rjl-microanalytic.de/wp-content/uploads/Component-cleanliness-testing-typical-specification.png)
The cleanliness test requires a precise determination of the number, geometry and material class of the residual dirt particles. Like all technical systems, the automatic SEM-EDX particle analysis is not completely error-free. Nevertheless, the testing laboratory must be able to reliably check the specifications.
With the Particle Browser we present a universal tool for follow-up control and revision.
Particle Browser
Basic functions & layout
![](https://www.rjl-microanalytic.de/wp-content/uploads/Particle-Browser-tool-layout-and-functions.png)
- Quick check ("click through")
- Sort by length & width
- Filter by material class
- Navigate by zoom & scroll
- Move SEM to particle position
- Check particle occupancy
- Detect stability problems
- Check plausibility at a glance
- Detect fragmented/overlapped particles
- Match morphology and spectrum
- Control of length/width
compatibility
Particle Browser can be used as a pure postprocessor for particle measurement data or in conjunction with SEM-EDX. The software is currently available for the following platforms:
Follow-up checks made easy
Developed from laboratory practice
The development of the Particle Browser was significantly influenced by our experience from our own testing laboratory. The main goal is efficiency: the laboratory technician must be able to carry out the follow-up check and revision of particle measurement data from the SEM-EDX particle analysis quickly and easily. Feedback from practice shows that the follow-up check significantly increases confidence in the results.
See for yourself: Every interested customer receives a free test license for Particle Browser. Quite a few customers come back enthusiastically and introduce Particle Browser as standard in their laboratory!
Benefits of follow-up
By checking individual particles, fragmented or overlapping particles as well as errors in material classification can be easily detected and corrected.
![](https://www.rjl-microanalytic.de/wp-content/uploads/Nachkontrolle-SEM-EDX-Partikel-Morphologie-Spektrum.png)
By inspecting the distribution map, the quality of the preparation and the stability of the image brightness can be easily checked.
![](https://www.rjl-microanalytic.de/wp-content/uploads/Nachkontrolle-SEM-EDX-Membrane-Mosaik.png)