SEM-EDX PARTICLE ANALYSER
Rapid Typing of Particles & Steel Inclusions
ASPEX PSEM Explorer
The fourth generation successor to the Aspex Explorer is a SEM-EDX system specifically developed for particle analysis. The instrument counts and measures particles and determines the material fully automatically.
The Explorer 4 is ideal for checking component cleanliness as well as for analyzing damage, steel inclusions and particles in the automotive and pharmaceutical industries.
Specifications
- Particle size from 0.5 µm
- SE and QuadBE detector
- High voltage variable 5 to 20 kV
- nitrogen-free SDD-EDX, 25 mm² 137 eV
- High vacuum, variable low pressure
- Slide-in sample chamber
- motorized stage XYZ 100 x 100 x 35 mm
- Windows PC, Perception Suite 2
- Recipe Automated Feature Sizing (RAFA)
- CleanCHK and Metals Quality Analyzer
The new Explorer 4 Analyzer offers complete integration of microscopic imaging and elemental analysis. The robust devices are used in industrial testing laboratories for quality control and particle analysis.