
Ultra-fast SEM-EDX analysis of residual dirt particles from 100 µm with the ParticleX
With modern SEM-EDX instruments, particle analysis of the entire filter is usually faster than a correlative approach. The Phenom ParticleX automates residual contamination analysis; no expert knowledge is required. And best of all: A single pass for particles as small as 100 µm typically takes only about 15 minutes. Watch the video to see for yourself!







