Simultaneous Microscopic Examination & Elemental Analysis
Operating Principle

In scanning electron microscopy (SEM), a focused primary electron beam is rastered stepwise across the sample. At each pixel, the reflected electrons are detected, yielding a microscopic greyscale image of the sample. There are two imaging techniques:

Backscattered electrons (BE) → material contrast

Secondary electrons (SE) → topography contrast

In addition, the primary electron beam triggers the sample to emit characteristic X-Rays. The elements in the sample as well as their respective modal weights can be precisely determined by analyzing the color spectrum in an EDX detector.

  • Investigation of damage and wearout cases at the microscopic level
  • Analysis of aging, corrosion and oxidation of components
  • Determining the origin of particles that lead to failure
  • Error analysis in the delamination of coatings and paints
  • Investigation of electrical contact problems
  • Analysis of surfaces and coatings
  • Material determination and microstructural analysis

Blasting material on CN membrane

Abrasive corundum particles

Aluminum chip on mesh filter

Acoustic foam

Sand particles

Contaminated glass particles