Contact  |  +49-7251-367-900

RJL Micro & Analytic
  • HOME
    • Contact
    • About Us
    • Team
    • News
    • Events
  • INSTRUMENTS
    • GUARANTEE
      We guarantee professional service & customer-oriented support before & after the purchase of a device. Therefore, we are a preferred partner for our customers from industry and academia.
    • TECHNOLOGIES
      • X-Ray Micro & Nano-CT
      • Particle Scanner
      • Tabletop SEM-EDX
      • SEM-EDX Particle Analyzer
      • Digital X-Ray Imaging
      • Raman Microscopy
      • Tabletop SIMS
    • BRANDS
      • Bruker SkyScan
      • MicroQuick
      • Coxem
      • Aspex Explorer
      • Kubtec
      • Nanophoton
      • MiniSIMS
  • LABORATORY
    • INTEGRITY
      Reliability and integrity towards our customers are the top goals that we work for on a daily basis. You can entrust us with your samples, we will deliver reliable results.
    • INFO & SERVICES
      • Service with Accreditation
      • Laboratory Equipment
      • Contact Partner
      • Getting in Touch
    • FIELDS OF WORK
      • Technical Cleanliness
      • X-Ray Microtomography
      • SEM-EDX analytics
      • Identification of Particles
      • Organic Substances
      • Analysis of Steel Inclusions
  • CLEANLINESS ANALYSIS
    • EXPERIENCE
      As one of the first test laboratories worldwide, we have, since 1998, obtained the expertise to perform component cleanliness analysis. Customers benefit from our state-of-the-art equipment and creative solutions.
    • INFO & SERVICES
      • Contamination Analysis
      • What is Technical Cleanliness?
      • Test Standards & Regulations
      • Seminars VDA-19 & ISO-16232
      • Analyses with Accreditation
    • DEVICES & PRODUCTS
      • MicroQuick Particle Scanner
      • SEM-EDX Particle Analyzer
      • MicroEx Extraction System
      • Particle Traps, Stamps, etc.
      • Distribution Worldwide
  • MICRO-CT
    • INNOVATION
      We have developed numerous new applications for microtomography with our customers. We look forward to every new challenge that we can solve with this exciting technology.
    • INFO & SERVICES
      • What is Microtomography?
      • Bruker SkyScan Instruments
      • Analyses with Accreditation
    • APPLICATIONS
      • Materials & Components
      • Filters, Composites & Foams
      • Tablets & Medical Devices
      • Biology, Archeology & Preclinical
      • 3D Particle Analysis
  • SEM-EDX
    • UNIVERSAL
      SEM-EDX devices combine microscopic imaging with spatially resolved elemental analysis. This universal tool must not be missing in any laboratory. Benefit from our years of experience.
    • INFO & PRODUCTS
      • How does SEM-EDX work?
      • Identification of particles
      • Analysis of Steel Inclusions
      • Coxem SEM-EDX tabletop instrument.
      • SEM-EDX Particle Analyzer
    • GUIDE
      • SEM-EDX: models and prices
      • Magnification and resolution
      • Detectors for SEM
      • electron source
      • Comfort and options
  • HOME
    • Contact
    • About Us
    • Team
    • News
    • Events
  • INSTRUMENTS
    • GUARANTEE
    • TECHNOLOGIES
      • X-Ray Micro & Nano-CT
      • Particle Scanner
      • Tabletop SEM-EDX
      • SEM-EDX Particle Analyzer
      • Digital X-Ray Imaging
      • Raman Microscopy
      • Tabletop SIMS
    • BRANDS
      • Bruker SkyScan
      • MicroQuick
      • Coxem
      • Aspex Explorer
      • Kubtec
      • Nanophoton
      • MiniSIMS
  • LABORATORY
    • INTEGRITY
    • INFO & SERVICES
      • Service with Accreditation
      • Laboratory Equipment
      • Contact Partner
      • Getting in Touch
    • FIELDS OF WORK
      • Technical Cleanliness
      • X-Ray Microtomography
      • SEM-EDX analytics
      • Identification of Particles
      • Organic Substances
      • Analysis of Steel Inclusions
  • CLEANLINESS ANALYSIS
    • EXPERIENCE
    • INFO & SERVICES
      • Contamination Analysis
      • What is Technical Cleanliness?
      • Test Standards & Regulations
      • Seminars VDA-19 & ISO-16232
      • Analyses with Accreditation
    • DEVICES & PRODUCTS
      • MicroQuick Particle Scanner
      • SEM-EDX Particle Analyzer
      • MicroEx Extraction System
      • Particle Traps, Stamps, etc.
      • Distribution Worldwide
  • MICRO-CT
    • INNOVATION
    • INFO & SERVICES
      • What is Microtomography?
      • Bruker SkyScan Instruments
      • Analyses with Accreditation
    • APPLICATIONS
      • Materials & Components
      • Filters, Composites & Foams
      • Tablets & Medical Devices
      • Biology, Archeology & Preclinical
      • 3D Particle Analysis
  • SEM-EDX
    • UNIVERSAL
    • INFO & PRODUCTS
      • How does SEM-EDX work?
      • Identification of particles
      • Analysis of Steel Inclusions
      • Coxem SEM-EDX tabletop instrument.
      • SEM-EDX Particle Analyzer
    • GUIDE
      • SEM-EDX: models and prices
      • Magnification and resolution
      • Detectors for SEM
      • electron source
      • Comfort and options

NEWS-BLOG

January 10, 2020 In Innovative Analytics, Cleanliness Analysis, SEM-EDX

Identification of tire abrasion microparticles using SEM-EDX

Autoreifen

According to a study by the Fraunhofer Institute UMSICHT in Oberhausen, vehicle tire wear is the world's largest source of microplastic. On average, a car tire weighs 1 to 1.5 kg less at the end of its life than at the beginning. This difference is largely released into the environment as microplastic particles.

In order to answer the question of the whereabouts of microplastic particles from tire abrasion, new analysis methods are urgently needed to reliably detect and count these particles. We have carried out a pilot study to explore the possibilities of automatic SEM-EDX analysis when quantifying tire abrasion in environmental samples.

Our project partner provided us with a sample taken from a real street. We prepared a portion of this particulate sample by means of vacuum filtration on a membrane.

strassen-kehricht-praepariert

In order to find the tire abrasion particles in the sample, we first took reference particles from real tires and analyzed them by SEM-EDX . The following shows a microscopic image and an element spectrum of a tire rubber particle on a silver membrane from the reference sample.

reifenabrieb SEM-EDX

A comparison of the abrasion of different brands has shown that tire rubber contains not only carbon (C), oxygen (O) and nitrogen (N), but also sulfur (S). Depending on the manufacturer, mineral and metallic fillers (Si, Ca, Al, Fe, Zn) are also added to define the hardness of the rubber. This chemical "fingerprint" is unique and allows the precise differentiation of tire wear from other inorganic and organic components that occur in street sweepings.

With this knowledge, we successfully identified and quantified the portion of tire wear in the sample by automated SEM-EDX particle analysis . In the following table we show exemplary results of the sample, the analysis shows all particles larger than 5 µm.

Reifenabrieb-Partikel-Analyse
Microplastics particle analysis Residual contaminates Contamination Analysis Cleanliness Analysis Cleanliness Inspection SEM-EDX

Related Articles

  • Wood-deformed-zoom
    Satisfied Coxem customer sends a panoramic greeting card
  • Coxem Tabletop SEM EDX EBSD IPF Map Aluminium foil
    EBSD implemented for the first time in a tabletop SEM-EDX

SUBJECTS

  • Company News (22)
  • Innovative Analytics (32)
  • X-Ray Tomography (14)
  • Cleanliness Analysis (12)
  • SEM-EDX (16)

by day

Component cleanliness Bruker Micro-CT Coxem EBSD Filmic contamination FTIR Industrial computer tomography Infrared spectroscopy ISO-16232 ISO-17025 Medical device Micro-CT MicroQuick Microplastics Microtomography molecular spectroscopy Nano-CT Nanotomography particle analysis Particle Scanner Pressestimme Preclinical imaging Raman spectroscopy Scanning electron microscopy purity Residual contaminates Contamination Analysis X-Ray imaging X-Ray analysis X-Ray Tomography Cleanliness Analysis Cleanliness Inspection SEM-EDX SkyScan Social commitment Job ad Technical Cleanliness VDA-19 VDI 2083 sheet 21

CONTACT US

Tel: + 49-7251-367-900
Fax: + 49-7251-367-9079
E-Mail: zentrale(at)rjl-microanalytic.de

VISIT US

Im Entenfang 11
76689 Karlsdorf-Neuthard
Deutschland / Germany

LEGAL

Imprint
Data Protection
Disclaimer
Sitemap
Conditions

RJL Micro & Analytic
  • HOME
  • INSTRUMENTS
  • LABORATORY
  • CLEANLINESS ANALYSIS
  • MICRO-CT
  • SEM-EDX
  • en_USEN

© RJL Micro & Analytic GmbH | all rights reserved | 1998-2021

en_USEN
de_DEDE en_USEN