PARTICLES PROBLEM? REMAINING DIRT ANALYSIS ROENTGEN HIGH RESOLUTION 3D X-RAY MICROSCOPY WHAT? HOW MUCH AND FROM WHERE? EDX ELEMENTAL ANALYSIS QUICK TEST CLEANLINESS VDA-19 PARTICLE SCANNER QUALITY TESTED ACCREDITED ANALYZES FASCINATING INSIGHTS X-RAY MICRO/NANO-CT REMAINING DIRT ANALYZE TECHNICAL CLEANLINESS TABLETS UNDERSTAND 3D MICROTOMOGRAPHY MATERIAL & STRUCTURE ANALYTICS CONSULT A TEST LABORATORY NON-DESTRUCTIVE TEST PORE ANALYSIS IN 3D DAMAGE HARD PARTICLES DETERMINE PARTICLE HARDNESS SPECTRAL PICTURES RAMAN MICROSCOPY INSIGHT PLEASE? 3D TAXONOMY VIRTUAL

High Aspect Ratio Tomography for Samples with a High Aspect Ratio

Bruker has developed a special scan mode for samples with a high aspect ratio for the latest generation of SkyScan micro-CT devices. Objects of this kind are characterized by a high ratio of length to width and always confront users of microtomography with major challenges.

With the High Aspect Ratio Tomography (HART Plus), the sample is not scanned with a fixed, but with a variable rotation step. The information content is at its highest especially at small transmission angles, which is why HART Plus scans in this area with a finer rotation step. 

The HART Plus method is particularly suitable for objects that are constructed as a layer system, for example for fuel cells, batteries, sensors and electrical components. The difference between standard scan and HART Plus can be clearly seen in the figure below. A ceramic film capacitor is shown here, the duration of the scan was, in both cases, 13 minutes. The result of HART Plus is convincing!

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