ONLINE BASIC COURSE
Cleanliness analysis according to VDA 19.1 & ISO-16232
Part 9
Presentation of Particle Cleanliness
For each particle type, the particle size distribution is typically plotted in a histogram against the maximum number of particles allowed (see figure).
Particle size distribution plotted as a histogram in a cleanliness report
By definition, any object detected on the filter is referred to as a particle. Particles are further divided into soft fibers and solid granules. Often, the soft fibers are neglected in a cleanliness specification, since their damage potential is considered low.
The automatic distinction between fibers and granules is based on a simple shape recognition. In addition, optical instruments are capable of detecting metallic reflections of particles. It has become common to distinguish between matt and metallic glossy particles. This typification allows a more accurate assessment of damage potential.
Nevertheless, it is to be emphasized that the identification of metals by means of light-optical methods represents more of an "estimate", rather than a reliable material analysis. Especially if particles have a corroded surface, which is often the case, metallic reflections cannot be seen. On the other side, metallic pseudo reflections can be caused by glossy plastic or glass particles. If a particle's material and thus its origin is to be reliably identified, other methods such as SEM-EDX or Molecular Spectroscopy have proven to be flawless.
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Online Basic Course
- (1) Standardized Analysis of Component Cleanliness
- (2) Particle Extraction from Component Surface
- (3) Filtration of the Residual Particles
- (4) Equipment for Extraction and Filtration
- (5) Gravimetric Analysis of Particle Mass
- (6) Scanner and Microscope for Standardized Analysis
- (7) Optical Analysis of Residual Contaminant Particles
- (8) Particle Analysis from 50 Microns
- (9) Presentation of Particle Cleanliness
- (10) Residual Contaminant Analysis Using SEM-EDX
- (1) Standardized Analysis of Component Cleanliness
- (2) Particle Extraction from Component Surface
- (3) Filtration of the Residual Particles
- (4) Equipment for Extraction and Filtration
- (5) Gravimetric Analysis of Particle Mass
- (6) Scanner and Microscope for Standardized Analysis
- (7) Optical Analysis of Residual Contaminant Particles
- (8) Particle Analysis from 50 Microns
- (9) Presentation of Particle Cleanliness
- (10) Residual Contaminant Analysis Using SEM-EDX