ONLINE BASIC COURSE
Cleanliness analysis according to VDA 19.1 & ISO-16232
Part 6
Scanner and Microscope for Standardized Analysis
The revised VDA volume 19.1 has picked up the trend towards simple devices for particle analysis, such as the optical scanner.
During the revision process, the VDA-19.1 industry association conducted a interlaboratory survey with established automatic light microscopes and the MicroQuick-Particle Scanner. The aim of this series of experiments was to establish a set of analytical parameters for all instruments in order to achieve the highest possible comparability of measurement results.
It has been found that a unified choice of illuminance and thresholds during segmentation can achieve a high accordance between microscopes and scanner.
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Online Basic Course
- (1) Standardized Analysis of Component Cleanliness
- (2) Particle Extraction from Component Surface
- (3) Filtration of the Residual Particles
- (4) Equipment for Extraction and Filtration
- (5) Gravimetric Analysis of Particle Mass
- (6) Scanner and Microscope for Standardized Analysis
- (7) Optical Analysis of Residual Contaminant Particles
- (8) Particle Analysis from 50 Microns
- (9) Presentation of Particle Cleanliness
- (10) Residual Contaminant Analysis Using SEM-EDX
- (1) Standardized Analysis of Component Cleanliness
- (2) Particle Extraction from Component Surface
- (3) Filtration of the Residual Particles
- (4) Equipment for Extraction and Filtration
- (5) Gravimetric Analysis of Particle Mass
- (6) Scanner and Microscope for Standardized Analysis
- (7) Optical Analysis of Residual Contaminant Particles
- (8) Particle Analysis from 50 Microns
- (9) Presentation of Particle Cleanliness
- (10) Residual Contaminant Analysis Using SEM-EDX