Contact  |  +49-7251-367-900

RJL Micro & Analytic
  • HOME
    • Contact
    • About Us
    • Team
    • News
    • Events
  • INSTRUMENTS
    • GUARANTEE
      We guarantee professional service & customer-oriented support before & after the purchase of a device. Therefore, we are a preferred partner for our customers from industry and academia.
    • TECHNOLOGIES
      • X-Ray Micro & Nano-CT
      • Particle Scanner
      • Tabletop SEM-EDX
      • SEM-EDX Particle Analyzer
      • Digital X-Ray Imaging
      • Raman Microscopy
      • Tabletop SIMS
    • BRANDS
      • Bruker SkyScan
      • MicroQuick
      • Coxem
      • Aspex Explorer
      • Kubtec
      • Nanophoton
      • MiniSIMS
  • LABORATORY
    • INTEGRITY
      Reliability and integrity towards our customers are the top goals that we work for on a daily basis. You can entrust us with your samples, we will deliver reliable results.
    • INFO & SERVICES
      • Service with Accreditation
      • Laboratory Equipment
      • Contact Partner
      • Getting in Touch
    • FIELDS OF WORK
      • Technical Cleanliness
      • X-Ray Microtomography
      • SEM-EDX analytics
      • Identification of Particles
      • Organic Substances
      • Analysis of Steel Inclusions
  • CLEANLINESS ANALYSIS
    • EXPERIENCE
      As one of the first test laboratories worldwide, we have, since 1998, obtained the expertise to perform component cleanliness analysis. Customers benefit from our state-of-the-art equipment and creative solutions.
    • INFO & SERVICES
      • Contamination Analysis
      • What is Technical Cleanliness?
      • Test Standards & Regulations
      • Seminars VDA-19 & ISO-16232
      • Analyses with Accreditation
    • DEVICES & PRODUCTS
      • MicroQuick Particle Scanner
      • SEM-EDX Particle Analyzer
      • MicroEx Extraction System
      • Particle Traps, Stamps, etc.
      • Distribution Worldwide
  • MICRO-CT
    • INNOVATION
      We have developed numerous new applications for microtomography with our customers. We look forward to every new challenge that we can solve with this exciting technology.
    • INFO & SERVICES
      • What is Microtomography?
      • Bruker SkyScan Instruments
      • Analyses with Accreditation
    • APPLICATIONS
      • Materials & Components
      • Filters, Composites & Foams
      • Tablets & Medical Devices
      • Biology, Archeology & Preclinical
      • 3D Particle Analysis
  • SEM-EDX
    • UNIVERSAL
      SEM-EDX devices combine microscopic imaging with spatially resolved elemental analysis. This universal tool must not be missing in any laboratory. Benefit from our years of experience.
    • INFO & PRODUCTS
      • How does SEM-EDX work?
      • Identification of particles
      • Analysis of Steel Inclusions
      • Coxem SEM-EDX tabletop instrument.
      • SEM-EDX Particle Analyzer
    • GUIDE
      • SEM-EDX: models and prices
      • Magnification and resolution
      • Detectors for SEM
      • electron source
      • Comfort and options
  • HOME
    • Contact
    • About Us
    • Team
    • News
    • Events
  • INSTRUMENTS
    • GUARANTEE
    • TECHNOLOGIES
      • X-Ray Micro & Nano-CT
      • Particle Scanner
      • Tabletop SEM-EDX
      • SEM-EDX Particle Analyzer
      • Digital X-Ray Imaging
      • Raman Microscopy
      • Tabletop SIMS
    • BRANDS
      • Bruker SkyScan
      • MicroQuick
      • Coxem
      • Aspex Explorer
      • Kubtec
      • Nanophoton
      • MiniSIMS
  • LABORATORY
    • INTEGRITY
    • INFO & SERVICES
      • Service with Accreditation
      • Laboratory Equipment
      • Contact Partner
      • Getting in Touch
    • FIELDS OF WORK
      • Technical Cleanliness
      • X-Ray Microtomography
      • SEM-EDX analytics
      • Identification of Particles
      • Organic Substances
      • Analysis of Steel Inclusions
  • CLEANLINESS ANALYSIS
    • EXPERIENCE
    • INFO & SERVICES
      • Contamination Analysis
      • What is Technical Cleanliness?
      • Test Standards & Regulations
      • Seminars VDA-19 & ISO-16232
      • Analyses with Accreditation
    • DEVICES & PRODUCTS
      • MicroQuick Particle Scanner
      • SEM-EDX Particle Analyzer
      • MicroEx Extraction System
      • Particle Traps, Stamps, etc.
      • Distribution Worldwide
  • MICRO-CT
    • INNOVATION
    • INFO & SERVICES
      • What is Microtomography?
      • Bruker SkyScan Instruments
      • Analyses with Accreditation
    • APPLICATIONS
      • Materials & Components
      • Filters, Composites & Foams
      • Tablets & Medical Devices
      • Biology, Archeology & Preclinical
      • 3D Particle Analysis
  • SEM-EDX
    • UNIVERSAL
    • INFO & PRODUCTS
      • How does SEM-EDX work?
      • Identification of particles
      • Analysis of Steel Inclusions
      • Coxem SEM-EDX tabletop instrument.
      • SEM-EDX Particle Analyzer
    • GUIDE
      • SEM-EDX: models and prices
      • Magnification and resolution
      • Detectors for SEM
      • electron source
      • Comfort and options

NEWS-BLOG

July 25, 2018 In Innovative Analytics, Cleanliness Analysis

Analysis of Foreign Particles in Pharmaceutical Powders

Tabletten

Avoiding the presence of visible foreign particles is a core requirement in the manufacturing of pharmaceutical products. Our test laboratory has developed a simple but innovative method that enables the reliable quantification of foreign particles in pharmaceutical powders.

Preparation by Dispersion in Air

Our preferential method of preparation for flowable powders is via the means of a dispersion tube onto a large CN membrane (∅ 150 mm). Following this technique, it is possible to examine ca. 100 mg of powder in a single step, increasing the statistical significance of the measurement.

dispersion-tube-for-pharma-powder
Preparation by Vacuum Filtration

Alternatively, the primary powder can be dissolved with a suitable solvent and the residue filtered onto a medium sized CN membrane (∅ 47 mm). This method assumes that the foreign particles are insolvable. The technique is particularly suitable for the investigation of metallic and mineral foreign particles ("elemental impurities").

vacuum-filtration-pharma-powder
Analysis Method for Foreign Particles

We utilize an optical measuring method based on an imaging scanner, in order to quickly and reliably detect all visible foreign particles. The measurement result is available in two minutes:

tabelle-fremdpartikel-pro-100mg

Alternatively, we offer the analysis of foreign particles by means of SEM-EDX. This method can detect the foreign particles while simultaneously typing the material.

Talk to ours experts and benefit from our many years of experience.

Component cleanliness ISO-16232 Residual contaminates Contamination Analysis X-Ray analysis Cleanliness Analysis SEM-EDX Technical Cleanliness VDA-19

Related Articles

  • Wood-deformed-zoom
    Satisfied Coxem customer sends a panoramic greeting card
  • Coxem Tabletop SEM EDX EBSD IPF Map Aluminium foil
    EBSD implemented for the first time in a tabletop SEM-EDX

SUBJECTS

  • Company News (22)
  • Innovative Analytics (32)
  • X-Ray Tomography (14)
  • Cleanliness Analysis (12)
  • SEM-EDX (16)

by day

Component cleanliness Bruker Micro-CT Coxem EBSD Filmic contamination FTIR Industrial computer tomography Infrared spectroscopy ISO-16232 ISO-17025 Medical device Micro-CT MicroQuick Microplastics Microtomography molecular spectroscopy Nano-CT Nanotomography particle analysis Particle Scanner Pressestimme Preclinical imaging Raman spectroscopy Scanning electron microscopy purity Residual contaminates Contamination Analysis X-Ray imaging X-Ray analysis X-Ray Tomography Cleanliness Analysis Cleanliness Inspection SEM-EDX SkyScan Social commitment Job ad Technical Cleanliness VDA-19 VDI 2083 sheet 21

CONTACT US

Tel: + 49-7251-367-900
Fax: + 49-7251-367-9079
E-Mail: zentrale(at)rjl-microanalytic.de

VISIT US

Im Entenfang 11
76689 Karlsdorf-Neuthard
Deutschland / Germany

LEGAL

Imprint
Data Protection
Disclaimer
Sitemap
Conditions

RJL Micro & Analytic
  • HOME
  • INSTRUMENTS
  • LABORATORY
  • CLEANLINESS ANALYSIS
  • MICRO-CT
  • SEM-EDX
  • en_USEN

© RJL Micro & Analytic GmbH | all rights reserved | 1998-2021

en_USEN
de_DEDE en_USEN