Contact  |  +49-7251-367-900

RJL Micro & Analytic
  • HOME
    • Contact
    • About Us
    • Team
    • News
    • Events
  • INSTRUMENTS
    • GUARANTEE
      We guarantee professional service & customer-oriented support before & after the purchase of a device. Therefore, we are a preferred partner for our customers from industry and academia.
    • TECHNOLOGIES
      • X-Ray Micro & Nano-CT
      • Particle Scanner
      • Tabletop SEM-EDX
      • SEM-EDX Particle Analyzer
      • Digital X-Ray Imaging
      • Raman Microscopy
      • Tabletop SIMS
    • BRANDS
      • Bruker SkyScan
      • MicroQuick
      • Coxem
      • Aspex Explorer
      • Kubtec
      • Nanophoton
      • MiniSIMS
  • LABORATORY
    • INTEGRITY
      Reliability and integrity towards our customers are the top goals that we work for on a daily basis. You can entrust us with your samples, we will deliver reliable results.
    • INFO & SERVICES
      • Service with Accreditation
      • Laboratory Equipment
      • Contact Partner
      • Getting in Touch
    • FIELDS OF WORK
      • Technical Cleanliness
      • X-Ray Microtomography
      • SEM-EDX analytics
      • Identification of Particles
      • Organic Substances
      • Analysis of Steel Inclusions
  • CLEANLINESS ANALYSIS
    • EXPERIENCE
      As one of the first test laboratories worldwide, we have, since 1998, obtained the expertise to perform component cleanliness analysis. Customers benefit from our state-of-the-art equipment and creative solutions.
    • INFO & SERVICES
      • Contamination Analysis
      • What is Technical Cleanliness?
      • Test Standards & Regulations
      • Seminars VDA-19 & ISO-16232
      • Analyses with Accreditation
    • DEVICES & PRODUCTS
      • MicroQuick Particle Scanner
      • SEM-EDX Particle Analyzer
      • MicroEx Extraction System
      • Particle Traps, Stamps, etc.
      • Distribution Worldwide
  • MICRO-CT
    • INNOVATION
      We have developed numerous new applications for microtomography with our customers. We look forward to every new challenge that we can solve with this exciting technology.
    • INFO & SERVICES
      • What is Microtomography?
      • Bruker SkyScan Instruments
      • Analyses with Accreditation
    • APPLICATIONS
      • Materials & Components
      • Filters, Composites & Foams
      • Tablets & Medical Devices
      • Biology, Archeology & Preclinical
      • 3D Particle Analysis
  • SEM-EDX
    • UNIVERSAL
      SEM-EDX devices combine microscopic imaging with spatially resolved elemental analysis. This universal tool must not be missing in any laboratory. Benefit from our years of experience.
    • INFO & PRODUCTS
      • How does SEM-EDX work?
      • Identification of particles
      • Analysis of Steel Inclusions
      • Coxem SEM-EDX tabletop instrument
      • SEM-EDX Particle Analyzer
    • GUIDE
      • SEM-EDX: models and prices
      • Magnification and resolution
      • Detectors for SEM
      • electron source
      • Comfort and options
  • HOME
    • Contact
    • About Us
    • Team
    • News
    • Events
  • INSTRUMENTS
    • GUARANTEE
    • TECHNOLOGIES
      • X-Ray Micro & Nano-CT
      • Particle Scanner
      • Tabletop SEM-EDX
      • SEM-EDX Particle Analyzer
      • Digital X-Ray Imaging
      • Raman Microscopy
      • Tabletop SIMS
    • BRANDS
      • Bruker SkyScan
      • MicroQuick
      • Coxem
      • Aspex Explorer
      • Kubtec
      • Nanophoton
      • MiniSIMS
  • LABORATORY
    • INTEGRITY
    • INFO & SERVICES
      • Service with Accreditation
      • Laboratory Equipment
      • Contact Partner
      • Getting in Touch
    • FIELDS OF WORK
      • Technical Cleanliness
      • X-Ray Microtomography
      • SEM-EDX analytics
      • Identification of Particles
      • Organic Substances
      • Analysis of Steel Inclusions
  • CLEANLINESS ANALYSIS
    • EXPERIENCE
    • INFO & SERVICES
      • Contamination Analysis
      • What is Technical Cleanliness?
      • Test Standards & Regulations
      • Seminars VDA-19 & ISO-16232
      • Analyses with Accreditation
    • DEVICES & PRODUCTS
      • MicroQuick Particle Scanner
      • SEM-EDX Particle Analyzer
      • MicroEx Extraction System
      • Particle Traps, Stamps, etc.
      • Distribution Worldwide
  • MICRO-CT
    • INNOVATION
    • INFO & SERVICES
      • What is Microtomography?
      • Bruker SkyScan Instruments
      • Analyses with Accreditation
    • APPLICATIONS
      • Materials & Components
      • Filters, Composites & Foams
      • Tablets & Medical Devices
      • Biology, Archeology & Preclinical
      • 3D Particle Analysis
  • SEM-EDX
    • UNIVERSAL
    • INFO & PRODUCTS
      • How does SEM-EDX work?
      • Identification of particles
      • Analysis of Steel Inclusions
      • Coxem SEM-EDX tabletop instrument
      • SEM-EDX Particle Analyzer
    • GUIDE
      • SEM-EDX: models and prices
      • Magnification and resolution
      • Detectors for SEM
      • electron source
      • Comfort and options

NEWS-BLOG

10th July 2018 In Innovative Analytics, Cleanliness Analysis, SEM-EDX

Erroneous Detection of Metallic Particles by Light Microscopy

Metallspaene

The identification of metallic particles is an important requirement in cleanliness analysis. In recent years, the light-optical detection of metallic particles has commonly been performed by the means of gloss. On the basis of our laboratory experience, we have found that the light microscopic analysis often leads to incorrect typifications, which can be easily avoided by a material analysis using SEM-EDX.

Light microscopy Compared to SEM-EDX

The light-microscopic detection of metallic particles is performed on the basis of light reflection. A particle is classified as metallic if it incorporates shiny spots. In all other cases, the particle is considered to be non-metallic. In SEM-EDX analysis a particle's X-Ray spectrum is measured, allowing its elemental components to be identified. This information enables a precise material typification.

Metallisch-glaenzende-Partikel-SEM-EDX
Do Metallic Particles Really Shine?

The analysis of reflections requires that metals on a filter membrane actually shine. Since the contaminant particles are exposed to liquids, temperature and friction during component processing, their surface is often non-shiny, but dull or corroded. These metallic particles are erroneously classified as non-metallic by light microscopy. In the following example, three particles (zinc, steel and aluminum) are shown, which have been recognized by light microscopy as non-metallic. However, the SEM-EDX analysis shows the metallic nature of these particles.

Nicht-glaenzende-Metalle-SEM-EDX
Light Microscopy Underestimates the Quantity of Metallic Particles

The following comparison with SEM-EDX shows just how serious the erroneous typification by light microscopy can be. The membrane as well as the result of optical particle analysis was provided to us by an automotive supplier. The comparison with SEM-EDX was carried out in our accredited test laboratory In this particular case, less than 1/60 of the actual metal particles were detected by light microscopy.

Vergleich-SEM-EDX-optische-Partikelanalyse
Our Recommendation to You

In applications where the reliable detection of metallic particles is critical for a component's functionality, e.g. electronical parts, we recommend particle analysis by the means of SEM-EDX. For routine analysis of component cleaning, the optical detection of metals should be completely eliminated and only the total number of particles should be considered instead. Talk to our experts and benefit from our many years of experience.

Component cleanliness ISO-16232 Residual contaminates Contamination Analysis X-Ray analysis Cleanliness Analysis SEM-EDX Technical Cleanliness VDA-19

Related Articles

  • Coxem Tabletop SEM EDX EBSD IPF Map Aluminium foil
    EBSD analytics implemented for the first time in a tabletop SEM-EDX
  • REM_EDX_Feldspat_Wachstumsringe
    Coxem introduces BE detector with excellent Z-resolution

SUBJECTS

  • Company News (20)
  • Innovative Analytics (31)
  • X-Ray Tomography (14)
  • Cleanliness Analysis (12)
  • SEM-EDX (15)

by day

Component cleanliness Bruker Micro-CT Coxem EBSD Filmic contamination FTIR Industrial computer tomography Infrared spectroscopy ISO-16232 ISO-17025 Medical device Micro-CT MicroQuick Microplastics Microtomography molecular spectroscopy Nano-CT Nanotomography particle analysis Particle Scanner Pressestimme Preclinical imaging Raman spectroscopy Scanning electron microscopy purity Residual contaminates Contamination Analysis X-Ray imaging X-Ray analysis X-Ray Tomography Cleanliness Analysis Cleanliness Inspection SEM-EDX SkyScan Social commitment Job ad Technical Cleanliness VDA-19 VDI 2083 sheet 21

CONTACT US

Tel: + 49-7251-367-900
Fax: + 49-7251-367-9079
E-Mail: zentrale(at)rjl-microanalytic.de

VISIT US

Im Entenfang 11
76689 Karlsdorf-Neuthard
Deutschland / Germany

LEGAL

Imprint
Data Protection
Disclaimer
Sitemap
Conditions

RJL Micro & Analytic
  • HOME
  • INSTRUMENTS
  • LABORATORY
  • CLEANLINESS ANALYSIS
  • MICRO-CT
  • SEM-EDX
  • en_USEN

© RJL Micro & Analytic GmbH | all rights reserved | 1998-2021

en_USEN
de_DEDE en_USEN